"Design of scan-testable CMOS sequential circuits."

Bong-Hee Park, Premachandran R. Menon (1990)

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DOI: 10.1109/TEST.1990.114044

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bong-Hee Park, Premachandran R. Menon:
Design of scan-testable CMOS sequential circuits. ITC 1990: 369-376

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