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"Design, Fabrications and Use of Mixed-Signal IC Testability Structures."
Kenneth P. Parker et al. (1997)
- Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa:
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498
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