Stop the war!
Остановите войну!
for scientists:
default search action
"Design of Scan-Based Path-Delay-Testable Sequential Circuits."
Ankan K. Pramanick, Sandip Kundu (1993)
- Ankan K. Pramanick, Sandip Kundu:
Design of Scan-Based Path-Delay-Testable Sequential Circuits. ITC 1993: 962-971
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.