"Lead Free Through Hole Technology (THT) and Contact Repeatability in ..."

Rosa D. Reinosa (2006)

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DOI: 10.1109/TEST.2006.297709

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Rosa D. Reinosa:
Lead Free Through Hole Technology (THT) and Contact Repeatability in In-Circuit Test. ITC 2006: 1-10

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