"Testability features of the first-generation CELL processor."

Mack W. Riley et al. (2005)

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DOI: 10.1109/TEST.2005.1583967

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mack W. Riley, Louis B. Bushard, Nathan Paul Chelstrom, Naoki Kiryu, Steven Ross Ferguson:
Testability features of the first-generation CELL processor. ITC 2005: 9

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