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"Use models for extending IEEE 1687 to analog test."

Peter Sarson, Jeff Rearick (2017)

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DOI: 10.1109/TEST.2017.8242068

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Peter Sarson, Jeff Rearick:
Use models for extending IEEE 1687 to analog test. ITC 2017: 1-8

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