"Problems Encountered in Developing VLSI Test Programs for COT (A Practical ..."

Beau R. Wilson Jr., Eugene R. Hnatek (1984)

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type: Conference or Workshop Paper

metadata version: 2007-01-24

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Beau R. Wilson Jr., Eugene R. Hnatek:
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788

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