"A comprehensive TCAM test scheme: An optimized test algorithm considering ..."

Hsiang-Huang Wu et al. (2009)

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DOI: 10.1109/TEST.2009.5355536

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu:
A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design. ITC 2009: 1-10

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