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"An Optimized DFT and Test Pattern Generation Strategy for an Intel High ..."

David M. Wu et al. (2004)

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DOI: 10.1109/TEST.2004.1386935

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/WuLRJST04
David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher:
An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. ITC 2004: 38-47

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