"Characterization of MEMS accelerometer self-noise by means of PSD and ..."

Antonino D'Alessandro et al. (2017)

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DOI: 10.1109/IWASI.2017.7974238

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Antonino D'Alessandro, Giovanni Vitale, Salvatore Scudero, Roberto D'Anna, Antonio Costanza, Adriano Fagiolini, Luca Greco:
Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis. IWASI 2017: 159-164

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