"Time Series Analysis of R&D Team Using Patent Information."

Yurie Iino, Sachio Hirokawa (2009)

Details and statistics

DOI: 10.1007/978-3-642-04592-9_58

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

a service of  Schloss Dagstuhl - Leibniz Center for Informatics