"Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells ..."

Víctor H. Champac et al. (2022)

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DOI: 10.1109/LATS57337.2022.9936923

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-20

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Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. LATS 2022: 1-6

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