"Influence of temperature on dynamic fault behavior due to resistive ..."

G. Cardoso Medeiros et al. (2018)

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DOI: 10.1109/LATW.2018.8349697

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-27

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G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS 2018: 1-6

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