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"Low voltage testing for interconnect opens under process variations."

Jesús Moreno, Víctor H. Champac, Michel Renovell (2012)

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DOI: 10.1109/LATW.2012.6261231

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/latw/MorenoCR12
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  persistent URL:
  - https://dblp.org/rec/conf/latw/MorenoCR12
Jesús Moreno, Víctor H. Champac, Michel Renovell:
Low voltage testing for interconnect opens under process variations. LATW 2012: 1-6

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