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"E-ECC: Low Power Erasure and Error Correction Schemes for Increasing ..."

Hsing Min Chen et al. (2015)

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DOI: 10.1145/2818950.2818961

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Hsing Min Chen, Akhil Arunkumar, Carole-Jean Wu, Trevor N. Mudge, Chaitali Chakrabarti:
E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems. MEMSYS 2015: 60-70

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