"Impact of ultra-thin-layer material parameters on the suppression of ..."

Tihomir Knezevic, Tomislav Suligoj, Lis K. Nanver (2019)

> Home

Details and statistics

DOI: 10.23919/MIPRO.2019.8757156

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/mipro/KnezevicSN19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mipro/KnezevicSN19
Tihomir Knezevic, Tomislav Suligoj, Lis K. Nanver:
Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers. MIPRO 2019: 24-29

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.