"A Parallel Approach for Testing Multi-Port Static Random Access Memories."

Farzin Karimi et al. (2001)

Details and statistics

DOI: 10.1109/MTDT.2001.945233

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics