"The phenomenon of "sharp corner" of Electrolyte-Oxide-Semiconductor ..."

J. G. Gao et al. (2014)

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DOI: 10.1109/NEMS.2014.6908821

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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J. G. Gao, H. Wang, P. C. Ma, Wengang Wu:
The phenomenon of "sharp corner" of Electrolyte-Oxide-Semiconductor structure for copper ions detection. NEMS 2014: 337-340

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