"Static Noise Margin Analysis of Sub-threshold SRAM Cells in Deep ..."

Armin Wellig, Julien Zory (2005)

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DOI: 10.1007/11556930_50

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Armin Wellig, Julien Zory:
Static Noise Margin Analysis of Sub-threshold SRAM Cells in Deep Sub-micron Technology. PATMOS 2005: 488-497

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