"Combining Instance-Based Learning and Logistic Regression for Multilabel ..."

Weiwei Cheng, Eyke Hüllermeier (2009)

> Home

Details and statistics

DOI: 10.1007/978-3-642-04180-8_6

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - conf/pkdd/ChengH09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/pkdd/ChengH09
Weiwei Cheng, Eyke Hüllermeier:
Combining Instance-Based Learning and Logistic Regression for Multilabel Classification. ECML/PKDD (1) 2009: 6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.