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"Explainable Process Monitoring Based on Class Activation Map: Garbage In, ..."

Cheolhwan Oh, Junhyung Moon, Jongpil Jeong (2020)

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DOI: 10.1007/978-3-030-66770-2_7

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-24

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Cheolhwan Oh, Junhyung Moon, Jongpil Jeong:
Explainable Process Monitoring Based on Class Activation Map: Garbage In, Garbage Out. IoT Streams/ITEM@PKDD/ECML 2020: 93-105

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