"Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power ..."

Yu Hu et al. (2005)

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DOI: 10.1109/PRDC.2005.26

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-14

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Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen:
Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. PRDC 2005: 175-182

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