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"Long Term Drift Observed in ISFET Due to the Penetration of H+ Ions into ..."

Chinmayee Hazarika, Sujan Neroula, Santanu Sharma (2019)

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DOI: 10.1007/978-3-030-34872-4_60

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

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  dblp key:
  - conf/premi/HazarikaNS19
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Chinmayee Hazarika, Sujan Neroula, Santanu Sharma:
Long Term Drift Observed in ISFET Due to the Penetration of H+ Ions into the Oxide Layer. PReMI (2) 2019: 543-553

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