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"Exploring the Feasibility of Low Cost Fault Injection Attacks on ..."

Alessandro Barenghi et al. (2011)

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DOI: 10.1007/978-3-642-25286-0_4

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-31

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  - conf/rfidsec/BarenghiHBSRK11
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Alessandro Barenghi, Cédric Hocquet, David Bol, François-Xavier Standaert, Francesco Regazzoni, Israel Koren:
Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation. RFIDSec 2011: 48-60

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