"Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single ..."

Alisson J. C. Lanot, Tiago R. Balen (2014)

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DOI: 10.1145/2660540.2660985

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Alisson J. C. Lanot, Tiago R. Balen:
Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. SBCCI 2014: 17:1-17:7

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