"Too trivial to test? An inverse view on defect prediction to identify ..."

Rainer Niedermayr, Tobias Röhm, Stefan Wagner (2020)

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DOI: 10.18420/SE2020_41

access: open

type: Conference or Workshop Paper

metadata version: 2022-12-07

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  dblp key:
  - conf/se/NiedermayrR020
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  persistent URL:
  - https://dblp.org/rec/conf/se/NiedermayrR020
Rainer Niedermayr, Tobias Röhm, Stefan Wagner:
Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk. SE 2020: 137-138

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