"Proceedings of the 2017 ACM SIGMETRICS / International Conference on ..."

Bruce E. Hajek et al. (2017)

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DOI: 10.1145/3078505

access: closed

type: Editorship

metadata version: 2021-07-30

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Bruce E. Hajek, Sewoong Oh, Augustin Chaintreau, Leana Golubchik, Zhi-Li Zhang:
Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017. ACM 2017, ISBN 978-1-4503-5032-7 [contents]

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