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"Micro interaction metrics for defect prediction."

Taek Lee et al. (2011)

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DOI: 10.1145/2025113.2025156

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Taek Lee, Jaechang Nam, DongGyun Han, Sunghun Kim, Hoh Peter In:
Micro interaction metrics for defect prediction. SIGSOFT FSE 2011: 311-321

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