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"Automatic extraction of component inspection regions from Printed Circuit ..."

Jun-Oh Kim, Youn-Ae Lee, Tae-Hyoung Park (2012)

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DOI: 10.1109/SII.2012.6427276

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-16

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Jun-Oh Kim, Youn-Ae Lee, Tae-Hyoung Park:
Automatic extraction of component inspection regions from Printed Circuit Board. SII 2012: 871-876

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