"Bit-Plane Specific Randomness Testing for Statistical Analysis of Ciphers."

Ram Ratan, Bharat Lal Jangid, Arvind (2019)

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DOI: 10.1007/978-981-15-3290-0_16

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-11

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Ram Ratan, Bharat Lal Jangid, Arvind:
Bit-Plane Specific Randomness Testing for Statistical Analysis of Ciphers. SocProS (1) 2019: 199-213

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