"Automatic Integration Test Generation from Unit Tests of eXVantage Product ..."

J. Jenny Li, David M. Weiss, J. Hamilton Slye (2007)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2021-01-14

- no documents available
- export record
  dblp key:
  - conf/splc/LiWS07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/splc/LiWS07
J. Jenny Li, David M. Weiss, J. Hamilton Slye:
Automatic Integration Test Generation from Unit Tests of eXVantage Product Family. SPLC (2) 2007: 73-80

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.