- Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh:
VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Communications in Computer and Information Science 711, Springer 2017, ISBN 978-981-10-7469-1 [contents]
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