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"VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, ..."

Anirban Sengupta et al. (2019)

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DOI: 10.1007/978-981-32-9767-8

access: closed

type: Editorship

metadata version: 2019-08-21

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Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma:
VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. Communications in Computer and Information Science 1066, Springer 2019, ISBN 978-981-32-9766-1 [contents]

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