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"VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, ..."
Ambika Prasad Shah et al. (2022)
- Ambika Prasad Shah
, Sudeb Dasgupta
, Anand D. Darji, Jaynarayan T. Tudu:
VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. Communications in Computer and Information Science 1687, Springer 2022, ISBN 978-3-031-21513-1 [contents]
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