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"Guided shifting of test pattern to minimize test time in serial scan."

Jaynarayan T. Tudu, Satyadev Ahlawat (2016)

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DOI: 10.1109/ISVDAT.2016.8064851

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/vdat/TuduA16
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Jaynarayan T. Tudu, Satyadev Ahlawat:
Guided shifting of test pattern to minimize test time in serial scan. VDAT 2016: 1-6

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