"A Test Method for Large-size TSV Considering Resistive Open Fault and ..."

Chang Hao, Xu Yong, Tianming Ni (2021)

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DOI: 10.1109/VLSI-DAT52063.2021.9427331

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-17

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Chang Hao, Xu Yong, Tianming Ni:
A Test Method for Large-size TSV Considering Resistive Open Fault and Leakage Fault Coexistence. VLSI-DAT 2021: 1-4

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