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"An FPGA-based test platform for analyzing data retention time distribution ..."

Chih-Sheng Hou et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533853

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Chih-Sheng Hou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
An FPGA-based test platform for analyzing data retention time distribution of DRAMs. VLSI-DAT 2013: 1-4

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