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"Statistical SDFC: A metric for evaluating test quality of small delay faults."

Xuefeng Zhu, Huawei Li, Xiaowei Li (2012)

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DOI: 10.1109/VLSI-DAT.2012.6212623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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Xuefeng Zhu, Huawei Li, Xiaowei Li:
Statistical SDFC: A metric for evaluating test quality of small delay faults. VLSI-DAT 2012: 1-4

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