"Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes."

Stephan Henzler et al. (2003)

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DOI: 10.1007/0-387-33403-3_15

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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  - conf/vlsi/HenzlerTKBGS03
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  - https://dblp.org/rec/conf/vlsi/HenzlerTKBGS03
Stephan Henzler, Philip Teichmann, Markus Koban, Jörg Berthold, Georg Georgakos, Doris Schmitt-Landsiedel:
Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes. VLSI-SoC (Selected Papers) 2003: 229-245

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