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"Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent ..."

Antonis Papanikolaou et al. (2006)

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DOI: 10.1007/978-0-387-74909-9_8

access: open

type: Conference or Workshop Paper

metadata version: 2019-09-04

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Antonis Papanikolaou, Hua Wang, Miguel Miranda, Francky Catthoor, Wim Dehaene:
Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System Design. VLSI-SoC (Selected Papers) 2006: 119-141

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