"An exact measurement and repair circuit of TSV connections for 128GB/s ..."

Dong-Uk Lee et al. (2014)

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DOI: 10.1109/VLSIC.2014.6858368

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Dong-Uk Lee, Kyung Whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin-Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sung-Joo Hong:
An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. VLSIC 2014: 1-2

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