"MIX: A Test Generation System for Synchronous Sequential Circuits."

Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/ICVD.1998.646649

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy:
MIX: A Test Generation System for Synchronous Sequential Circuits. VLSI Design 1998: 456-463

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