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"Evaluating the Reliability of Defect-Tolerant Architectures for ..."

Gethin Norman et al. (2004)

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DOI: 10.1109/ICVD.2004.1261046

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Gethin Norman, David Parker, Marta Z. Kwiatkowska, Sandeep K. Shukla:
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking. VLSI Design 2004: 907-

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