"Dynamic test Sequence compaction for Sequential Circuits."

Anand Raghunathan, Srimat T. Chakradhar (1996)

Details and statistics

DOI: 10.1109/ICVD.1996.489479

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics