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"Optimization of Test Accesses with a Combined BIST and External Test Scheme."

Makoto Sugihara, Hiroto Yasuura (2002)

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DOI: 10.1109/ASPDAC.2002.995014

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-14

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  dblp key:
  - conf/vlsid/SugiharaY02
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/SugiharaY02
Makoto Sugihara, Hiroto Yasuura:
Optimization of Test Accesses with a Combined BIST and External Test Scheme. ASP-DAC/VLSI Design 2002: 683-688

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