"Region Feature-Guided Automated Seed Selection Region Growing Method for ..."

Wuyue Ma (2024)

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DOI: 10.1145/3708568.3708577

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-12

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Wuyue Ma:
Region Feature-Guided Automated Seed Selection Region Growing Method for Chip-Surface-Defect Detection. VSIP 2024: 55-61

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