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ORCID"24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, ..."
- 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. IEEE Computer Society 2006, ISBN 0-7695-2514-8 [contents]
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