"Automatic test stimulus generation for accurate diagnosis of RF systems ..."

Aritra Banerjee et al. (2011)

> Home

Details and statistics

DOI: 10.1109/VTS.2011.5783755

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vts/BanerjeeSDC11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/BanerjeeSDC11
Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. VTS 2011: 58-63

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.