"Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical ..."

Ishaan Bassi, Sule Ozev, Doohwang Chang (2021)

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DOI: 10.1109/VTS50974.2021.9441000

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-09

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Ishaan Bassi, Sule Ozev, Doohwang Chang:
Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. VTS 2021: 1-7

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