"DEFUSE: A Deterministic Functional Self-Test Methodology for Processors."

Li Chen, Sujit Dey (2000)

Details and statistics

DOI: 10.1109/VTEST.2000.843853

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics